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Title |
Date of Issue |
U.S. Patent Number |
| Homodyne interferometer and method of sensing material |
May 4, 1999 |
5,900,935 |
| Single beam laser surface velocity and displacement measurement apparatus |
Dec. 28, 1999 |
6,008,887 |
| Enhanced non-steady-state photo-induced electromotive force detector |
Jan. 29, 2002 |
6,342,721 |
| Laser-based glass thickness measurement system and method |
Dec. 17, 2002 |
6,496,268 |
| Enhanced photo-emf sensor with high bandwidth and large field of view |
Nov. 16, 2004 |
6,818,880 |
| Material thickness measurement and apparatus |
Jan. 4, 2005 |
6,837,109 |
| Method and device for ultrasonic vibration detection during high-performance machining |
Oct. 10, 2006 |
7,117,741 |
| Laser-ultrasonic detection of flip chip attachment defects |
Feb. 5, 2008 |
7,327,448 |
| Laser-ultrasonic detection of subsurface defects in processed metals |
Oct. 9, 2007 |
7,278,315 |
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Laser Ultrasonics